Influence of tip indentation depth on the adhesive behavior of viscoelastic polydimethylsiloxane networks studied by atomic force microscopy

Pascal Viville, Alain Deffieux, Michel Schappacher, Philippe Leclère, Jean Luc Brédas, Roberto Lazzaroni

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

A commercial atomic force microscope (AFM) outfitted with a custom control and data acquisition system was used to investigate the adhesive nature of a viscoelastic polydimethylsiloxane (PDMS) network. Due to the complex dependence of the adhesion of this sample on factors such as indentation, surface dwell time, applied stress and sample memory effects, total control of the applied stress profile between the AFM tip and sample was necessary. Since the force curves were analyzed automatically on-line, large amounts of data could be rapidly collected, alleviating the time-consuming task of off-line analysis. The adhesive response is shown to increase with increasing interaction time and the maximum applied load. The results are rationalized by considering the time-dependent stress relaxation behavior of the PDMS network as it is deformed by the AFM tip.

Original languageEnglish (US)
Pages (from-to)189-199
Number of pages11
JournalMacromolecular Symposia
Volume167
DOIs
StatePublished - Jun 6 2001

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Organic Chemistry
  • Polymers and Plastics
  • Materials Chemistry

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