In-situ TEM electrical and mechanical properties measurements of one-dimensional inorganic nanomaterials

D. Golberg*, P. M.F.J. Costa, M. Mitome, Y. Bando

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The unique possibilities of Current-Voltage (I-V) and Force-Displacement (F-D) curve recordings from individual lD-nanostructures inside high-resolution transmission electron microscopes are demonstrated. The examples include Ga-filled MgO, In-filled SiO2 and pure multi-walled BN nanotubes.

Original languageEnglish (US)
Title of host publication2008 2nd IEEE International Nanoelectronics Conference, INEC 2008
Pages1127-1131
Number of pages5
DOIs
StatePublished - 2008
Externally publishedYes
Event2008 2nd IEEE International Nanoelectronics Conference, INEC 2008 - Shanghai, China
Duration: Mar 24 2008Mar 27 2008

Other

Other2008 2nd IEEE International Nanoelectronics Conference, INEC 2008
CountryChina
CityShanghai
Period03/24/0803/27/08

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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