In Situ Demonstration of the Link Between Mechanical Strength and Resistive Switching in Resistive Random-Access Memories

Yuanyuan Shi, Yanfeng Ji, Fei Hui, Montserrat Nafria, Marc Porti, Gennadi Bersuker, Mario Lanza

Research output: Contribution to journalArticlepeer-review

11 Scopus citations
Original languageEnglish (US)
JournalAdvanced Electronic Materials
Volume1
Issue number4
DOIs
StatePublished - Apr 1 2015
Externally publishedYes

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