Improvement of the electrical contact resistance at rough interfaces using two dimensional materials

Jianchen Hu, Chengbin Pan, Heng Li, Panpan Shen, Hui Sun, Huiling Duan, Mario Lanza

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Reducing the electronic contact resistance at the interfaces of nanostructured materials is a major goal for many kinds of planar and three dimensional devices. In this work, we develop a method to enhance the electronic transport at rough interfaces by inserting a two dimensional flexible and conductive graphene sheet. We observe that an ultra-thin graphene layer with a thickness of 0.35 nm can remarkably reduce the roughness of a sample in a factor of 40%, avoiding the use of thick coatings, leading to a more homogeneous current flow, and extraordinarily increasing the total current compared to the graphene-free counterpart. Due to its simplicity and performance enhancement, this methodology can be of interest to many interface and device designers.
Original languageEnglish (US)
JournalJournal of Applied Physics
Volume118
Issue number21
DOIs
StatePublished - Dec 7 2015
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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