Impact of NBTI and CHC stress on the nanoscale electrical properties of strained and non-strained MOSFETs

Q. Wu, M. Porti, A. Bayerl, M. Lanza, J. Martin-Martinez, R. Rodriguez, M. Nafria, X. Aymerich, E. Simoen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

In this work, the impact of Negative Bias Temperature Instability (NBTI) and Channel Hot Carrier (CHC) stresses on different regions along the channel of the MOSFET gate dielectric is analyzed at the nanoscale with Conductive Atomic Force Microscope (CAFM). In particular, it is demonstrated that, while the BTI degradation is homogeneous, the CHC stress degradation is higher close to source (S) and drain (D). When comparing strained and non-strained channel devices, the results show that strained devices are more sensitive to CHC stress.
Original languageEnglish (US)
Title of host publicationProceedings of the 2015 10th Spanish Conference on Electron Devices, CDE 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479981083
DOIs
StatePublished - Jan 1 2015
Externally publishedYes

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