Highly Accurate Thickness Determination of 2D Materials

Yiping Xiao, Wenwen Zheng, Bin Yuan, Chao Wen, Mario Lanza

Research output: Contribution to journalArticlepeer-review

Abstract

Determining the thickness of two-dimensional (2D) materials accurately and reliably is highly necessary for multiple investigations, but at the same time it can be quite complex. Most studies in this field measure a topographic map at the edge of the 2D material using an atomic force microscope (AFM), and plot a single-line cross-section using the software of the AFM. However, this method is highly inaccurate and can result in high relative errors due to surface roughness and line-to-line variability. This is even more important in ultrathin (
Original languageEnglish (US)
Pages (from-to)2100056
JournalCrystal Research and Technology
DOIs
StatePublished - May 6 2021

ASJC Scopus subject areas

  • Materials Science(all)
  • Chemistry(all)
  • Condensed Matter Physics

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