The efficient coloration of LiF material, in the form of bulk and films, by EUV and soft X-rays emitted by a laser-plasma source is demonstrated. The short penetration depth of soft-X-rays is exploited to obtain high spatial resolution luminescent patterns while the high dynamic range of proportionality between X-ray dose and coloration is exploited for using LiF as image detector in micro-radiography and soft X-ray microscopy applications.
|Original language||English (US)|
|Number of pages||5|
|Journal||Proceedings of SPIE - The International Society for Optical Engineering|
|State||Published - 2002|
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics