Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

M. Lanza, A. Bayerl, T. Gao, M. Porti, M. Nafria, G. Y. Jing, Y. F. Zhang, Z. F. Liu, H. L. Duan

Research output: Contribution to journalArticlepeer-review

47 Scopus citations

Abstract

Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Original languageEnglish (US)
Pages (from-to)1440-1444
Number of pages5
JournalAdvanced Materials
Volume25
Issue number10
DOIs
StatePublished - Mar 13 2013
Externally publishedYes

ASJC Scopus subject areas

  • Mechanics of Materials
  • Materials Science(all)
  • Mechanical Engineering

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