Flipping nanoscale ripples of free-standing graphene using a scanning tunneling microscope tip

Romain Breitwieser, Yu Cheng Hu, Yen Cheng Chao, Ren Jie Li, Yi Ren Tzeng, Lain-Jong Li, Sz Chian Liou, Keng Ching Lin, Chih Wei Chen, Woei Wu Pai*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

We present a scanning tunneling microscopy study of the stress-strain behavior of a rippled single-layer free-standing graphene (FSG) and report that FSG exhibits a non-linear sigmoidal stress-strain behavior. We managed to pull and push nanoripples by controlling the STM tip-FSG interaction forces. In this way, we found that the initial deformations of a rippled FSG involve sign reversals of the nanoripple's local curvatures, termed "flipping". In contrast to elastic deformation of graphene, flipping of a FSG nanoripple encounters a stress barrier and therefore makes a rippled FSG metastable, as evidenced by monitoring a yielding process in both experiments and molecular dynamics simulations. The evolution of nanoripples subjected to STM control is also fully consistent with atom-resolved images. Our work therefore shows how rippled 2D carbon deforms at nanoscale.

Original languageEnglish (US)
Pages (from-to)236-243
Number of pages8
JournalCarbon
Volume77
DOIs
StatePublished - Jan 1 2014

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)

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