Fermat's interferometric principles for multiple reflection tomography

Gerard T. Schuster*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Interferometric forms of Femat's principle are derived that converts traveltimes of free-surface multiples into those for lower-order events such as primary reflections, These primary reflection traveltimes can then be used to tomographically invert for layer velocities more accurately than standard traveltime tomography applied to multiples. As an example, Format's interferrometric principle converts VSP (vertical-seismic-profile) traveltimes of receiver-side ghosts and direct, waves to those for CDP (common-depth-point) primary reflections. These CDP traveltimes can be used to estimate, e.g., statics velocities for a 3D survey, which is impossible by conventional VSP tomography applied to primary traveltimes. This procedure is exact in the high frequency approximation, and it, can be extended to multiples in CDP and earthquake data. Fermat's interferometric principles presents new opportunities for imaging multiples and usefully extends the illumination area of conventional VSP. CDP and earthquake traveltime tomography.

Original languageEnglish (US)
Title of host publication67th European Association of Geoscientists and Engineers, EAGE Conference and Exhibition, incorporating SPE EUROPEC 2005 - Extended Abstracts
PublisherSociety of Petroleum Engineers
Pages63-67
Number of pages5
Volume67th European Association of Geoscientists and Engineers Conference and Exhibition 2005: The Challenge of Discovery. Incorpor...
ISBN (Print)9073781981, 9789073781986
StatePublished - 2005
Externally publishedYes
Event67th European Association of Geoscientists and Engineers, EAGE Conference and Exhibition, incorporating SPE EUROPEC 2005 - Extended Abstracts - Feria de Madrid, Spain
Duration: Jun 13 2005Jun 16 2005

Other

Other67th European Association of Geoscientists and Engineers, EAGE Conference and Exhibition, incorporating SPE EUROPEC 2005 - Extended Abstracts
CountrySpain
CityFeria de Madrid
Period06/13/0506/16/05

ASJC Scopus subject areas

  • Engineering(all)

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