Far infrared near normal specular reflectivity of Nix(SiO2)1-x (x = 1.0, 0.84, 0.75, 0.61, 0.54, 0.28) granular films

Néstor E. Massa, Juliano C. Denardin, Leandro M. Socolovsky, Marcelo Knobel, Fernando Pablo De La Cruz, Xixiang Zhang

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Engineering & Materials Science

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