Fabrication of tuning-fork based AFM and STM tungsten probe

Hisham Al-Falih, Yasser Khan, Yaping Zhang, Damian San Roman Alerigi, Dong Kyu Cha, Boon S. Ooi, Tien Khee Ng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ∼10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications. © 2011 IEEE.
Original languageEnglish (US)
Title of host publication8th International Conference on High-capacity Optical Networks and Emerging Technologies
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages190-192
Number of pages3
ISBN (Print)9781457711695
DOIs
StatePublished - Dec 2011

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