Magnetic force microscopy probes were obtained via the solution phase electrochemical deposition of cobalt nanostructures at the probe apexes. Single tips were fabricated in an atomic force microscope fluid cell. Multiple tips were produced in a single batch with an alternating potential in an electrochemical cell. The probes achieve 50 nm spatial resolution.
|Original language||English (US)|
|Journal||Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures|
|State||Published - Sep 28 2007|
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering