Scanning probe microscopes (SPM) are commonly used for characterization of the topographic and electrical properties of materials at the nanoscale. In such setup, the probes play a prominent role to obtain reliable imaging, but most tips lose their intrinsic properties after some measurements. Here, we modified the metal varnished atomic force microscope tips by transferring a sheet of graphene on them. The resulting graphene micro-electromechanical system (MEMS) - AFM tips are characterized by means of optical microscope, scanning electron microscope (SEM), energy dispersive X-ray microscope (EDX) and atomic force microscope (AFM). Our graphene-coated tips achieved lifetimes 10 times larger than the uncoated counterparts, improving the quality and reducing the cost of research.
|Original language||English (US)|
|Title of host publication||Proceedings of the 2015 10th Spanish Conference on Electron Devices, CDE 2015|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|State||Published - Jan 1 2015|