Electron and x-ray diffraction study of ZnTe-ZnS strained-layer superlattices grown by molecular beam epitaxy

Takeshi Karasawa*, Kazuhiro Ohkawa, Tsuneo Mitsuyu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

Reflection high-energy electron diffraction observation during the growth of ZnTe-ZnS strained-layer superlattices shows that sharp streaks of the substrate were replaced by a spotty pattern which eventually elongated into streaks. X-ray diffraction data of the superlattice with small period show satellite peaks around an intense central peak. These studies indicate a good superlattice structure for the samples with small (<50 Å) periods.

Original languageEnglish (US)
Pages (from-to)117-119
Number of pages3
JournalApplied Physics Letters
Volume54
Issue number2
DOIs
StatePublished - Dec 1 1989

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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