Electrical transport properties of oligothiophene-based molecular films studied by current sensing atomic force microscopy

Bas L M Hendriksen, Florent Martin, Yabing Qi, Clayton Mauldin, Nenad Vukmirovic, Junfeng Ren, Herbert Wormeester, Allard J. Katan, Virginia Altoe, Shaul Aloni, Jean M J Fréchet, Lin Wang Wang, Miquel Salmeron*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

Abstract

Using conducting probe atomic force microscopy (CAFM) we have investigated the electrical conduction properties of monolayer films of a pentathiophene derivative on a SiO2/Si-p+ substrate. By a combination of current-voltage spectroscopy and current imaging we show that lateral charge transport takes place in the plane of the monolayer via hole injection into the highest occupied molecular orbitals of the pentathiophene unit. Our CAFM data suggest that the conductivity is anisotropic relative to the crystalline directions of the molecular lattice.

Original languageEnglish (US)
Pages (from-to)4107-4112
Number of pages6
JournalNano Letters
Volume11
Issue number10
DOIs
StatePublished - Oct 12 2011
Externally publishedYes

Keywords

  • conduction anisotropy
  • current sensing atomic force microscopy
  • Langmuir-Blodgett monolayer
  • lateral transport
  • molecular electronics
  • Oligothiophene

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Electrical transport properties of oligothiophene-based molecular films studied by current sensing atomic force microscopy'. Together they form a unique fingerprint.

Cite this