Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

Jennifer L.M. Rupp*, Patrick Reinhard, Daniele Pergolesi, Thomas Ryll, Rene Tölke, Enrico Traversa

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Fingerprint

Dive into the research topics of 'Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films'. Together they form a unique fingerprint.

Physics & Astronomy