Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

Jennifer L.M. Rupp*, Patrick Reinhard, Daniele Pergolesi, Thomas Ryll, Rene Tölke, Enrico Traversa

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O 3-d perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 °C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 °C under bias of ±15 V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas.

Original languageEnglish (US)
Article number012101
JournalApplied Physics Letters
Volume100
Issue number1
DOIs
StatePublished - Jan 2 2012

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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