Effect of milling process on the magnetic properties of FIB patterned magnetic nanostructures

Dan You, Zhiyong Liu, Zaibing Guo, Yuankai Zheng, Yihong Wu

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    There has been much interest in nano-patterning of hard and soft magnetic materials and perpendicular recording media using the FIB technique, but very few of them has been focused on the milling process and its effect on the magnetic properties of the patterned nanostructures. In this work, the FIB patterning of commercial post-sputtering longitudinal media has been performed with emphasis on how the redeposition would affect the morphology of the patterned structure as well as its magnetic properties. The former was studied using AFM and the latter by MFM.

    Original languageEnglish (US)
    Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    ISBN (Electronic)0780373650, 9780780373655
    DOIs
    StatePublished - 2002
    Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
    Duration: Apr 28 2002May 2 2002

    Other

    Other2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
    CountryNetherlands
    CityAmsterdam
    Period04/28/0205/2/02

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering
    • Surfaces, Coatings and Films

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