Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Ruipeng Li, Jeremy W. Ward, Detlef Matthias Smilgies, Marcia M. Payne, John Edward Anthony, Oana D. Jurchescu, Aram Amassian

Research output: Contribution to journalArticlepeer-review

54 Scopus citations

Abstract

X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Original languageEnglish (US)
Pages (from-to)5553-5558
Number of pages6
JournalAdvanced Materials
Volume24
Issue number41
DOIs
StatePublished - Aug 10 2012

ASJC Scopus subject areas

  • Mechanics of Materials
  • Materials Science(all)
  • Mechanical Engineering

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