Direct measurement of graphene contact resistivity to pre-deposited metal in buried contact test structure

Ramy M. Qaisi, Casey Smith, Mohamed T. Ghoneim, Qingkai Yu, Muhammad Mustafa Hussain

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We demonstrate a buried contact based novel test structure for direct contact resistivity measurement of graphene-metal interfaces. We also observe excellent contact resistivity 1 μO-cm2 without any additional surface modification suggesting that the intrinsic Au-graphene contact is sufficient for achieving devices with low contact resistance. The chemical mechanical polishing less test structure and data described herein highlights an ideal methodology for systematic screening and engineering of graphene-metal contact resistivity to enable low power high speed carbon electronics. © 2013 IEEE.
Original languageEnglish (US)
Title of host publication2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages890-893
Number of pages4
ISBN (Print)9781479906758
DOIs
StatePublished - Aug 2013

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