Digital Holography Microscopy (DHM) operating in pulsed stroboscopic mode: A versatile metrology instrument for micro and nano technology

Frédéric Montfort*, François Marquet, Etienne Cuche, Nicolas Aspert, Eduardo Solanas, Yves Emery, Christian Depeursinge

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Process engineering and failure analysis of MEMS and MOEMS require static and dynamical characterization of both their in-plane and out of plane response to an excitation. A remarkable characteristic of Digital Holography Microscopes (DHM) is the extremely short acquisition time required to grab the whole information necessary to provide 3D optical topography of the sample: a unique frame grab, without any vertical or lateral scan provides the information over the full field of view. First, it ensures DHM measurements to be insensitive to vibrations. Second, it opens the door to fast dynamical characterization of micro-systems. For periodic movement analysis, DHM can operate in two stroboscopic modes with standard cameras. The first one enables precise characterization up to excitation frequencies of 100 kHz with recovery cycle of 10% simply by triggering properly the camera. The second one uses a pulsed source for investigation of higher excitation frequencies. For non periodic movement analysis fast acquisition cameras and postponed treatment are used. DHM are therefore unique and very efficient tool for dynamical characterization of inplane and out-of-plane response. In this paper we illustrate the two stroboscopic modes with an example of a high frequency micro mirror.

Original languageEnglish (US)
Title of host publicationOptomechatronic Sensors and Instrumentation III
Volume6716
DOIs
StatePublished - 2007
Externally publishedYes
EventOptomechatronic Sensors and Instrumentation III - Lausanne, Switzerland
Duration: Oct 8 2007Oct 10 2007

Other

OtherOptomechatronic Sensors and Instrumentation III
CountrySwitzerland
CityLausanne
Period10/8/0710/10/07

Keywords

  • Digital holography microscopy
  • Dynamical analysis
  • Failure analysis
  • Interferometer resolution
  • MEMS & MOEMS

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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