Digital holographic microscopy applied to metrology

Christian D. Depeursinge*, Florian Charrière, Anca M. Marian, Frederic Montfort, Tristan Colomb, Jonas Kühn, Etienne Cuche, Y. Emery, Pierre Marquet, Pierre J. Magistretti

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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