Diffractive optical elements for differential interference contrast x-ray microscopy

Enzo Di Fabrizio*, Dan Cojoc, Stefane Cabrini, Burkhard Kaulich, Jean Susini, Paolo Facci, Thomas Wilhein

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

50 Scopus citations

Abstract

In this paper we introduce phase diffractive optical elements (DOEs) that beside simple focusing, can perform new optical functions in the range of x-rays. In particular, the intensity of the wavefront can be distributed with almost complete freedom. We calculated and fabricated high resolution DOEs that can focus a monochromatic x-ray beam into multiple spots displaced in a single or two planes along the optical axis or can shape the beam into a desired continuous geometrical pattern. The possibility to introduce a specified phase shift between the generated spots, which can increase the image contrast, is demonstrated by preliminary results obtained from computer simulations and experiments performed in visible light. The functionality of the DOEs has been tested successfully in full-field differential interference contrast (DIC) x-ray microscopy at the ID21 beamline of the European Synchrotron Radiation Facility (ESRF) operated at 4 keV photon energy.

Original languageEnglish (US)
Pages (from-to)2278-2288
Number of pages11
JournalOptics Express
Volume11
Issue number19
DOIs
StatePublished - Jan 1 2003

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Fingerprint

Dive into the research topics of 'Diffractive optical elements for differential interference contrast x-ray microscopy'. Together they form a unique fingerprint.

Cite this