Differential interference contrast x-ray microscopy with twin zone plates

Burkhard Kaulich*, Thomas Wilhein, Enzo Di Fabrizio, Filippo Romanato, Matteo Altissimo, Stefano Cabrini, Barbara Fayard, Jean Susini

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

56 Scopus citations

Abstract

X-ray imaging in differential interference contrast (DIC) with submicrometer optical resolution was performed by using a twin zone plate (TZP) setup generating focal spots closely spaced within the TZP spatial resolution of 160 nm. Optical path differences introduced by the sample are recorded by a CCD camera in a standard full-field imaging and by an aperture photodiode in a standard scanning transmission x-ray microscope. Applying this x-ray DIC technique, we demonstrate for both the full-field imaging and scanning x-ray microscope methods a drastic increase in image contrast (approximately 20×) for a low-absorbing specimen, similar to the Nomarski DIC method for visible-light microscopy.

Original languageEnglish (US)
Pages (from-to)797-806
Number of pages10
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Volume19
Issue number4
DOIs
StatePublished - Jan 1 2002

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Vision and Pattern Recognition

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