Differential interference contrast x-ray microscopy with submicron resolution

Thomas Wilhein*, Burkhard Kaulich, Enzo Di Fabrizio, Fillipo Romanato, Stefano Cabrini, Jean Susini

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

86 Scopus citations

Abstract

Progress in lithography and nanofabrication [E. Di Fabrizio et al., Nature (London) 401, 895 (1999)] has made it possible to apply differential interference contrast (DIC) in x-ray microscopy using an original x-ray doublet lens based on two specially developed zone plates. Switching from bright-field imaging (absorption contrast) to x-ray DIC, we observe, similar to visible-light microscopy, a dramatic increase in image contrast for weak absorbing samples. We anticipate that this technique will have a significant impact on x-ray imaging and may play a role comparable to DIC imaging in visible-light microscopy.

Original languageEnglish (US)
Pages (from-to)2082-2084
Number of pages3
JournalApplied Physics Letters
Volume78
Issue number14
DOIs
StatePublished - Apr 2 2001
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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