Differential interference contrast for X-ray microscopy: Fabrication and characterization of twin zone plate optics

Enzo Di Fabrizio*, Burkhard Kaulich, Thomas Wilhein, Jean Susini

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

A novel X-ray technique for converting the phase information of weakly absorbing specimen into strong image contrast similar to Nomarski differential interference contrast (DIC) is presented. DIC for X-rays is accomplished by the fabrication of a novel X-ray optic (TZP) consisting of two zone plates (ZPs) on both sides of the same substrate, laterally shifted by about one outermost zone width. The feasibility of DIC for X-rays was proven at the ID 21 X-ray microscopy beamline at the ESRF using a full-field imaging microscope and a scanning transmission X-ray microscope, which were operated at 4 keV photon energy. In both microscopes, we observe a tremendous contrast enhancement of up to a factor of 25. Though first experiments were carried out at 4 keV photon energy, this X-ray DIC technique can be adapted to any photon energy where ZPs with appropriate parameters and imaging performance can be designed and manufactured.

Original languageEnglish (US)
Pages (from-to)243-248
Number of pages6
JournalSurface Review and Letters
Volume9
Issue number1
DOIs
StatePublished - Feb 2002
Externally publishedYes

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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