Development of a hard x-ray imaging microscope

B. Lai*, W. Yun, Y. Xiao, L. Yang, D. Legnini, Z. Cai, A. Krasnoperova, F. Cerrina, Enzo Di Fabrizio, L. Grella, M. Gentili

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

50 Scopus citations

Abstract

A hard x-ray imaging microscope based on a phase zone plate has been developed and tested. The zone plate, with a 5 cm focal length and a 0.2 μm smallest linewidth, was used to image 8 keV x rays from the samples. The imaging microscope can be used to obtain nearly diffraction-limited resolution over the entire imaging field, and its resolution is almost independent of source size and source motions. We have tested such an imaging microscope, and a resolution of about 0.4 μm was obtained. The images were obtained with an exposure time of less than 1 min, for a magnification factor of 30 in the x rays. The x rays were then converted into visible light, and another 7 times magnification were obtained by using a lens system coupled to a charge coupled device camera. The results from the imaging microscope, and possible applications, will be discussed.

Original languageEnglish (US)
Pages (from-to)2287-2289
Number of pages3
JournalReview of Scientific Instruments
Volume66
Issue number2
DOIs
StatePublished - Dec 1 1995

ASJC Scopus subject areas

  • Instrumentation

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