Determination of contact resistivity by the cox and strack method for metal contacts to bulk bismuth antimony telluride

R. P. Gupta, J. B. White, O. D. Iyore, U. Chakrabarti, Husam Niman Alshareef, B. E. Gnade

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

We successfully demonstrate the application of the Cox and Strack (CS) technique for contact resistivity measurement of metal contacts to bulk bismuth antimony telluride. The transmission line method (TLM), typically used for thin films, gives inconsistent contact resistivity results for bulk thermoelectric (TE) materials. Using TLM we observed a 10× variation in measured contact resistivity for the TE material thickness range of 300-1000 μm. In contrast, the CS method gives a <3% variation over the same substrate thickness range. We propose that this variability difference is related to the direction of current flow in the bulk TE materials.

Original languageEnglish (US)
JournalElectrochemical and Solid-State Letters
Volume12
Issue number8
DOIs
StatePublished - Jun 29 2009

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Materials Science(all)
  • Physical and Theoretical Chemistry
  • Electrochemistry
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Determination of contact resistivity by the cox and strack method for metal contacts to bulk bismuth antimony telluride'. Together they form a unique fingerprint.

Cite this