Controlling coverage of solution cast materials with unfavourable surface interactions

V. M. Burlakov, G. E. Eperon, H. J. Snaith, S. J. Chapman, A. Goriely

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

Abstract

Creating uniform coatings of a solution-cast material is of central importance to a broad range of applications. Here, a robust and generic theoretical framework for calculating surface coverage by a solid film of material de-wetting a substrate is presented. Using experimental data from semiconductor thin films as an example, we calculate surface coverage for a wide range of annealing temperatures and film thicknesses. The model generally predicts that for each value of the annealing temperature there is a range of film thicknesses leading to poor surface coverage. The model accurately reproduces solution-cast thin film coverage for organometal halide perovskites, key modern photovoltaic materials, and identifies processing windows for both high and low levels of surface coverage. © 2014 AIP Publishing LLC.
Original languageEnglish (US)
Pages (from-to)091602
JournalApplied Physics Letters
Volume104
Issue number9
DOIs
StatePublished - Mar 3 2014
Externally publishedYes

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