Control charts and efficient sampling methodologies in the field of photovoltaics

C. Allebé, B. Govaerts, E. Van Kerschaver*, S. De Wolf, J. Szlufcik

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.

Original languageEnglish (US)
Title of host publicationCONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002
PublisherIEEE
Pages387-390
Number of pages4
ISBN (Print)0-7803-7471-1
StatePublished - May 19 2002
Externally publishedYes
Event29th IEEE Photovoltaic Specialists Conferenc - NEW ORLEANS
Duration: May 19 2002May 24 2002

Conference

Conference29th IEEE Photovoltaic Specialists Conferenc
CityNEW ORLEANS
Period05/19/0205/24/02

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Control charts and efficient sampling methodologies in the field of photovoltaics'. Together they form a unique fingerprint.

Cite this