Abstract
Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.
Original language | English (US) |
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Title of host publication | CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002 |
Publisher | IEEE |
Pages | 387-390 |
Number of pages | 4 |
ISBN (Print) | 0-7803-7471-1 |
State | Published - May 19 2002 |
Externally published | Yes |
Event | 29th IEEE Photovoltaic Specialists Conferenc - NEW ORLEANS Duration: May 19 2002 → May 24 2002 |
Conference
Conference | 29th IEEE Photovoltaic Specialists Conferenc |
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City | NEW ORLEANS |
Period | 05/19/02 → 05/24/02 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Condensed Matter Physics