Control charts and efficient sampling methodologies in the field of photovoltaics

C. Allebé; B. Govaerts; E. Van Kerschaver; S. De Wolf; J. Szlufcik

Control charts and efficient sampling methodologies in the field of photovoltaics

C. Allebé, B. Govaerts, E. Van Kerschaver^*, S. De Wolf, J. Szlufcik

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.

Original language	English (US)
Title of host publication	CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002
Publisher	IEEE
Pages	387-390
Number of pages	4
ISBN (Print)	0-7803-7471-1
State	Published - May 19 2002
Externally published	Yes
Event	29th IEEE Photovoltaic Specialists Conferenc - NEW ORLEANS Duration: May 19 2002 → May 24 2002

Conference

Conference	29th IEEE Photovoltaic Specialists Conferenc
City	NEW ORLEANS
Period	05/19/02 → 05/24/02

ASJC Scopus subject areas

Control and Systems Engineering
Condensed Matter Physics

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

@inproceedings{fd7a6393f8a141b0a851c93014d1f435,

title = "Control charts and efficient sampling methodologies in the field of photovoltaics",

abstract = "Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.",

author = "C. Alleb{\'e} and B. Govaerts and {Van Kerschaver}, E. and {De Wolf}, S. and J. Szlufcik",

year = "2002",

month = may,

day = "19",

language = "English (US)",

isbn = "0-7803-7471-1",

pages = "387--390",

booktitle = "CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002",

publisher = "IEEE",

note = "29th IEEE Photovoltaic Specialists Conferenc ; Conference date: 19-05-2002 Through 24-05-2002",

}

Control charts and efficient sampling methodologies in the field of photovoltaics. / Allebé, C.; Govaerts, B.; Van Kerschaver, E.; De Wolf, S.; Szlufcik, J.

CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002. IEEE, 2002. p. 387-390.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Control charts and efficient sampling methodologies in the field of photovoltaics

AU - Allebé, C.

AU - Govaerts, B.

AU - Van Kerschaver, E.

AU - De Wolf, S.

AU - Szlufcik, J.

PY - 2002/5/19

Y1 - 2002/5/19

N2 - Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.

AB - Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.

UR - http://www.scopus.com/inward/record.url?scp=0036948551&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0036948551

SN - 0-7803-7471-1

SP - 387

EP - 390

BT - CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002

PB - IEEE

T2 - 29th IEEE Photovoltaic Specialists Conferenc

Y2 - 19 May 2002 through 24 May 2002

ER -

Control charts and efficient sampling methodologies in the field of photovoltaics

Abstract

Conference

ASJC Scopus subject areas

UN SDGs

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