Conductive AFM of 2D materials and heterostructures for nanoelectronics

Filippo Giannazzo, Giuseppe Greco, Fabrizio Roccaforte, Chandreswar Mahata, Mario Lanza

Research output: Chapter in Book/Report/Conference proceedingChapter

4 Scopus citations

Abstract

Two-dimensional materials (2DM), such as the semimetal graphene, semiconducting MoS2 and insulating h-BN, are currently the object of wide interests for next generation electronic applications. Despite recent progresses in large area synthesis of 2DMs, their electronic properties are still affected by nano- or micro-scale defects/inhomogeneities related to the specific growth process. Electrical scanning probe methods, such as conductive atomic force microscopy (C-AFM), are essential tools to investigate charge transport phenomena in 2DMs with nanoscale resolution. This chapter illustrates some case studies of C-AFM applications to graphene, MoS2 and h-BN. Furthermore, the results of the nanoscale electrical characterization have been correlated to the behavior of macroscopic devices fabricated on these materials.
Original languageEnglish (US)
Title of host publicationNanoScience and Technology
PublisherSpringer Verlagservice@springer.de
Pages303-350
Number of pages48
DOIs
StatePublished - Jan 1 2019
Externally publishedYes

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