Comparing Low Coherence Interferometry with conventional methods of measuring paper roughness

Tuukka Prykäri*, Erkki Alarousu, Risto Myllylä

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

This paper introduces optical non-contact paper surface characterization based on Low Coherence Interferometry (LCI). Using this technique, the roughness of two different types of fine paper series are measured and the obtained results are compared to those of two air leak methods, PPS and Bendtsen, which are used as reference methods.

Original languageEnglish (US)
Title of host publicationSaratov Fall Meeting 2006
Subtitle of host publicationCoherent Optics of Ordered and Random Media VII
Volume6536
DOIs
StatePublished - 2007
Externally publishedYes
EventSaratov Fall Meeting 2006: Coherent Optics of Ordered and Random Media VII - Saratov, Russian Federation
Duration: Sep 26 2006Sep 30 2006

Other

OtherSaratov Fall Meeting 2006: Coherent Optics of Ordered and Random Media VII
CountryRussian Federation
CitySaratov
Period09/26/0609/30/06

Keywords

  • Non-contact
  • Optical
  • Profilometry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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