Charge trapping in resistance degraded ferroelectrics

W. L. Warren*, G. E. Pike, D. Dimos, B. A. Tuttle, Husam Niman Alshareef

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

Thermally stimulated current (TSC) and electron paramagnetic resonance (EPR) spectroscopies have been used to examine the role of defects in BaTiO3 capacitors that have been subjected to an electric field at elevated temperatures (an accelerated aging process). The aging process caused a reduction in the insulation resistance of the ferroelectric capacitor and induced a voltage offset in its polarizationvoltage hysteresis loop. The TSC measurements following resistance degradation show the displacement of positively charged oxygen vacancies and the motion of bulk trapped charge. It is found that the aging process is accompanied by a significant amount of charge trapping that appears to be locally charge compensated. EPR measurements show that some of the trapped charge is associated with changes in the oxidation state of acceptor impurities. Last, it is shown that some of the trapped charge in the ferroelectric is directly associated with the net polarization.

Original languageEnglish (US)
Pages (from-to)49-61
Number of pages13
JournalIntegrated Ferroelectrics
Volume18
Issue number1-4
StatePublished - Dec 1 1998

Keywords

  • Charge traps
  • Oxygen vacancies
  • Resistance degradation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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