Characterization of rhenium oxide films and their application to liquid crystal cells

E. Cazzanelli, M. Castriota, S. Marino, N. Scaramuzza*, J. Purans, A. Kuzmin, R. Kalendarev, G. Mariotto, Gobind Das

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    29 Scopus citations

    Abstract

    Rhenium trioxide exhibits high electronic conductivity, while its open cubic crystal structure allows an appreciable hydrogen intercalation, generating disordered solid phases, with protonic conductivity. Rhenium oxide thin films have been obtained by thermal evaporation of ReO3 powders on different substrates, maintained at different temperatures, and also by reactive magnetron sputtering of a Re metallic target. A comparative investigation has been carried out on these films, by using micro-Raman spectroscopy and x-ray diffraction. Two basic types of solid phases appear to grow in the films: a red metallic Hx ReO3 compound, with distorted perovskite structures, like in the bulk material, and ordered HReO4 crystals based on tetrahedral perrhenate ions. Because of its conduction properties, the electrical and electro-optical behaviors of ReO3 films deposited on standard indium tin oxide/glass substrate have been tested inside asymmetric nematic liquid crystal cells, showing an appreciable capability of rectification of their electro-optical response, in similar way to tungsten trioxide.

    Original languageEnglish (US)
    Article number114904
    JournalJournal of Applied Physics
    Volume105
    Issue number11
    DOIs
    StatePublished - Jul 6 2009

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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