Characterization of Pt nanocontacts to ZnO nanowires using focused-ion-beam deposition

Pei Hsin Chang*, Kun Tong Tsai, Cheng Ying Chen, Jr-Hau He

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

Understanding the transport across the contact between a metal electrode and ZnO is a key issue to fabricating high performance ZnO nanowire-based nanodevices. In this study, we have characterized the contact between the focused-ion-beam-microscopy-deposited Pt and ZnO nanowires. The dominant transport mechanism of the contact is the thermionic field emission (TFE) process. It is found that the presence of Ga plays an important role to tune the thermionic emission into TFE transport. The discovered phenomena and underlying mechanisms are not only of broad scientific interests but also of great technological significance, since understanding the transport of semiconductor nanostructures paves the way to fabricate high performance of nanowire-based devices.

Original languageEnglish (US)
Pages (from-to)197-204
Number of pages8
JournalMaterials Research Society Symposium Proceedings
Volume1142
StatePublished - Nov 20 2009
Event2008 MRS Fall Meeting - Boston, MA, United States
Duration: Dec 1 2008Dec 5 2008

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Characterization of Pt nanocontacts to ZnO nanowires using focused-ion-beam deposition'. Together they form a unique fingerprint.

Cite this