Carrier behavior in the vicinity of pit defects in GaN characterized by ultraviolet light-assisted Kelvin probe force microscopy

CuiHong Kai, XiaoJuan Sun, YuPing Jia, Zhiming Shi, Ke Jiang, JianWei Ben, You Wu, Yong Wang, HeNan Liu, Xiaohang Li, DaBing Li

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Physics & Astronomy