BRDF acquisition with basis illumination

Abhijeet Ghosh*, Shruthi Achutha, Wolfgang Heidrich, Matthew O'Toole

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

54 Scopus citations

Abstract

Realistic descriptions of surface reflectance have long been a topic of interest in both computer vision and computer graphics research. In this paper, we describe a novel and fast approach for the acquisition of bidirectional reflectance distribution functions (BRDFs). We develop a novel theory for directly measuring BRDFs in a basis representation by projecting incident light as a sequence of basis functions from a spherical zone of directions. We derive an orthonormal basis over spherical zones that is ideally suited for this task. BRDF values outside the zonal directions are extrapolated by re-projecting the zonal measurements into a spherical harmonics basis, or by fitting analytical reflection models to the data. We verify this approach with a compact optical setup that requires no moving parts and only a small number of image measurements. Using this approach, a BRDF can be measured in just a few minutes.

Original languageEnglish (US)
DOIs
StatePublished - Dec 1 2007
Event2007 IEEE 11th International Conference on Computer Vision, ICCV - Rio de Janeiro, Brazil
Duration: Oct 14 2007Oct 21 2007

Other

Other2007 IEEE 11th International Conference on Computer Vision, ICCV
CountryBrazil
CityRio de Janeiro
Period10/14/0710/21/07

ASJC Scopus subject areas

  • Software
  • Computer Vision and Pattern Recognition

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