Atomic resolution Z-contrast imaging and EELS: Application for Ge/SiO 2 interface

S. Lopatin*, G. Duscher, W. Windl

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)818-819
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
StatePublished - 2003
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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