Atomic force microscopy: Loading position dependence of cantilever spring constants and detector sensitivity

Ivan Uriev Vakarelski*, Scott A. Edwards, Raymond R. Dagastine, Derek Y.C. Chan, Geoffrey W. Stevens, Franz Grieser

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

A simple and accurate experimental method is described for determining the effective cantilever spring constant and the detector sensitivity of atomic force microscopy cantilevers on which a colloidal particle is attached. By attaching large (approximately 85 μm diameter) latex particles at various positions along the V-shaped cantilevers, we demonstrate how the normal and lateral spring constants as well as the sensitivity vary with loading position. Comparison with an explicit point-load theoretical model has also been used to verify the accuracy of the method.

Original languageEnglish (US)
Article number116102
JournalReview of Scientific Instruments
Volume78
Issue number11
DOIs
StatePublished - Dec 10 2007

ASJC Scopus subject areas

  • Instrumentation

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