ANALYSIS OF VLSI INTERCONNECT STRUCTURES.

Lawrence Carin, Qiang Xu, Kevin J. Webb, Joseph A. McClintock

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

A typical VLSI circuit contains a large number of devices with planar metallic interconnects between them. Frequently, these interconnects are in the form of microstrip, analogous to what might be used in a millimeter-wave or microwave integrated circuit. Results of theoretical and experimental studies of the the device interconnect problem are presented. Multiple-line terminated and unterminated problems were treated. Full-wave data for pulse- and time-harmonic propagation are presented. Theoretical and experimental frequency- and time-domain data for the two-line problem are given which include effects of device terminations. These results illustrate the time and spatial coupling phenomena for typical VLSI geometries.
Original languageEnglish (US)
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherIEEENew York, NY, USA
Pages625-628
Number of pages4
DOIs
StatePublished - Jan 1 1987
Externally publishedYes

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