Analysis of self-correcting active pixel sensors

Khaled Nabil Salama*, Ahmad Al-Yamani

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Abstract

This paper evaluates the operation of self-correcting active pixel sensors presented in [6] using Signal-to-Noise Ratio. The evaluation is based on a simplified Active Pixel Sensing (APS) model. We show that in the absence of stuck faults (i.e., no errors) the performance of the system suffers from considerable degradation especially at low illumination (i.e., typical indoor scenes). We use the same model to quantify the number of defective pixels under which self correction is beneficial.

Original languageEnglish (US)
Article number30
Pages (from-to)262-269
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5668
DOIs
StatePublished - Jul 20 2005
EventProceedings of SPIE-IS and T Electronic Imaging - Image Quality and System Performance II - San Jose, CA, United States
Duration: Jan 18 2005Jan 20 2005

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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