An exact analysis of the impact of fading correlation on the average level crossing rate and average outage duration of selection combining

Lin Yang*, Mohamed-Slim Alouini

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

13 Scopus citations

Abstract

This paper derives the average level crossing rate (LCR) and the average outage duration (AOD) of selection combining (SC) over correlated and/or unbalanced channels. More specifically, it presents a general approach for the analysis of such systems operating over correlated Rayleigh, Rician, and/or Nakagami fading channels. The general approach is then applied to obtain generic closed-form expressions for the LCR and AOD of dual-branch SC in a correlated Rayleigh and Nakagami fading environment. The results obtained as special cases of the offered generic closed-form expressions are compared to those previously reported in the literature. Finally, some numerical examples comparing the LCR and AOD of SC with various value of fading correlation, average fading power unbalance, and Nakagami parameter are provided and discussed.

Original languageEnglish (US)
Pages (from-to)241-245
Number of pages5
JournalIEEE Vehicular Technology Conference
Volume57
Issue number1
StatePublished - Sep 1 2003
Event57th IEEE Semiannual Vehicular Technology Conference (VTC2003) - Jeju, Korea, Republic of
Duration: Apr 22 2003Apr 25 2003

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Applied Mathematics

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