Addressing Vibrational Excitations in Van der Waals Materials and Molecular Layers Within Electron Energy Loss Spectroscopy

A. Konečná, A. A. Govyadinov, T. Neuman, A. Chuvilin, S. Vélez, I. Dolado, Sergei Lopatin, A. Y. Nikitin, F. Casanova, L. E. Hueso, R. Hillenbrand, J. Aizpurua

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Only recently, specially designed instrumentation for spatially-resolved electron energy-loss spectroscopy (EELS) has been developed to increase the attainable spectral resolution and the operating spectral range [1]. This progress has dramatically broadened the potential for applications of EELS for probing low-loss vibrational excitations. Pioneering experiments have demonstrated the capability of the fast electrons in Scanning Transmission Electron Microscopy (STEM) to probe vibrational fingerprints in organic samples [2], ionic crystals [3], and also in van der Waals materials [4].
    Original languageEnglish (US)
    Pages (from-to)408-409
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume24
    Issue numberS1
    DOIs
    StatePublished - Aug 6 2018

    ASJC Scopus subject areas

    • Instrumentation

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