A microspectroscopic study of cap damage in annealed RE-doped AlN-capped GaN

E. Nogales*, K. Lorenz, K. Wang, Iman Roqan, R. W. Martin, K. P. O'Donnell, E. Alves, S. Ruffenach, O. Briot

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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