A high-sensitivity photon counting imaging system (PCIS) for luminescence analysis

I. McCulloch, N. A. Spooner*, D. Jones

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    5 Scopus citations

    Abstract

    The Photon Counting Imaging System (PCIS) has been developed to extend the capabilities of traditional luminescence dating technologies by providing a spatially-resolved (imaged) output and a significantly extended spectral range for the detection of luminescence signals, at an overall sensitivity comparable to that of non-imaging luminescence detectors. It is capable of a wide range of both luminescence dating and materials analysis applications, utilising a variety of optical stimulation sources in addition to thermal stimulation, and incorporates easily inter-changeable optical filters for the spectral discrimination of luminescence emissions.

    Original languageEnglish (US)
    Pages (from-to)1566-1570
    Number of pages5
    JournalRadiation Measurements
    Volume46
    Issue number12
    DOIs
    StatePublished - Dec 1 2011

    Keywords

    • IRSL
    • Luminescence imaging
    • Offner
    • OSL
    • Single grain dating
    • TL

    ASJC Scopus subject areas

    • Radiation
    • Instrumentation

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