A method for measuring thermal diffusivity/conductivity of a microscale sample includes placing a metallic disk atop the sample, and disposing a nanomembrane over the sample and over the metallic disk so that the nanomembrane, so that the metallic disk, the nanomembrane and the sample are in thermal equilibrium with one another. A laser beam is directed to fall onto the nanomembrane over the sample, while a radiation sensor is operated to detect photoluminescent radiation emitted by the nanomembrane in response to the laser beam. A spectral shift in the detected photoluminescent radiation emitted by the nanomembrane is determined, and thermal diffusivity/conductivity is calculated from the determined spectral shift of the photoluminescence.
|Original language||English (US)|
|Patent number||WO 2017125866 A1|
|State||Published - Jul 27 2017|