A fast stroud-based collocation method for statistically characterizing EMI/EMC phenomena on complex platforms

Hakan Baǧi*, Abdulkadir C. Yücel, Jan S. Hesthaven, Eric Michielssen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

71 Scopus citations

Fingerprint

Dive into the research topics of 'A fast stroud-based collocation method for statistically characterizing EMI/EMC phenomena on complex platforms'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science