A fast stroud-based collocation method for statistically characterizing EMI/EMC phenomena on complex platforms

Hakan Baǧi*, Abdulkadir C. Yücel, Jan S. Hesthaven, Eric Michielssen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

71 Scopus citations

Abstract

A fast stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on electrically large and loaded platforms is presented. Uncertainties in electromagnetic excitations and/or system geometries and configurations are parameterized in terms of random variables having normal or beta probability density functions. A fast time-domain integral-equation-based field-cable-circuit simulator is used to perform deterministic EMI/EMC simulations for excitations and/or system geometries and configurations specified by Stroud integration rules. Outputs of these simulations then are processed to compute averages and standard deviations of pertinent observables. The proposed Stroud-based collocation method requires far fewer deterministic simulations than Monte Carlo or tensor-product integrators. To demonstrate the accuracy, efficiency, and practicality of the proposed method, it is used to statistically characterize coupled voltages at the feed pins of cable-interconnected and shielded computer cards as well as the terminals of cables situated inside the bay of an airplane cockpit.

Original languageEnglish (US)
Pages (from-to)301-311
Number of pages11
JournalIEEE Transactions on Electromagnetic Compatibility
Volume51
Issue number2
DOIs
StatePublished - Apr 30 2009

Keywords

  • Electromagnetic coupling
  • Electromagnetic interference and compatibility (EMI/EMC)
  • Fast solvers
  • Hybrid simulators
  • Stochastic collocation
  • Stroud integration rules
  • Time-domain integral equations

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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