Field emission scanning electron microscope capable of producing images of a sample by scanning with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. It is an SEM capable of imaging magnetic nano particles with no image distortion for non-conductives samples such as minerals, ceramics, glass and polymers.
|Name||Zeiss Merlin SEM|
|Manufacturers||Carl Zeiss SMT AG|
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